BAASANA
International Review of Business and Applied Sciences (IRBAS)
International Journal of Business & Applied Sciences (IJBAS) is an international double-blind peer-reviewed journal published by the Business and Applied Sciences Academy of North America (BAASANA) that provides guidance for those involved at all levels of business and applied sciences. This journal promotes and publishes conceptual papers/models, qualitative research, pedagogical research, practice notes, and case studies, and professional interviews in business and applied sciences.
International Journal of Business & Applied Sciences
International Journal of Business & Applied Sciences (IJBAS) is an international double-blind peer-reviewed journal published by Business and Applied Sciences Academy of North America (BAASANA) that provides guidance for those involved at all levels of business and applied sciences. The IJBAS is unique in the sense that it encourages interdisciplinary research and provides a platform for dialogue among researchers in general business and applied sciences. The journal publishes research papers, the results, and analysis of which will have implications or relevance to policymakers and practitioners in relevant fields. While IJBAS gives priority to empirical/analytical research papers, it also publishes original conceptual papers, review papers, case studies, and book reviews.
Special Issues devoted to important topics in business, applied sciences, and related topics, will be occasionally published.
The journal is an invaluable support to academics and researchers in the field and to all those charged with setting policies and strategies for business and social organizations.
READERSHIP
Professionals, academics, researchers, managers, and policymakers
EDITORS
Dr. Yam B. Limbu, Editor-in-Chief
Montclair State University, USA
Email: ijbasj@gmail.com or yam_limbu@baasana.org
Dr. M. Ruhul Amin, Managing Editor
Bloomsburg University of Pennsylvania, USA
Email: ruhul_amin@baasana.org or baasana2@gmail.com
Margaret Cox, Technical Editor
Hampton University, USA